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김성진

Kim, Seong-Jin
Bio-inspired Advanced Sensors Lab.
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dc.citation.endPage 1274 -
dc.citation.number 11 -
dc.citation.startPage 1272 -
dc.citation.title IEEE ELECTRON DEVICE LETTERS -
dc.citation.volume 31 -
dc.contributor.author Kim, Seong-Jin -
dc.contributor.author Han, Sang-Wook -
dc.contributor.author Kang, Byongmin -
dc.contributor.author Lee, Keechang -
dc.contributor.author Kim, James D. K. -
dc.contributor.author Kim, Chang-Yeong -
dc.date.accessioned 2023-12-22T06:40:17Z -
dc.date.available 2023-12-22T06:40:17Z -
dc.date.created 2015-07-16 -
dc.date.issued 2010-11 -
dc.description.abstract A pixel architecture for providing not only normal 2-D images but also depth information by using a conventional pinned photodiode is presented. This pixel architecture allows the sensor to generate a real-time 3-D image of an arbitrary object. The operation of the pixel is based on the time-of-flight principle detecting the time delay between the emitted and reflected infrared light pulses in a depth image mode. The pixel contains five transistors. Compared to the conventional 4-T CMOS image sensor, the new pixel includes an extra optimized transfer gate for high-speed charge transfer. A fill factor of more than 60% is achieved with a 12 × 12 μm2 size for increasing the sensitivity. A fabricated prototype sensor successfully captures 64 × 16 depth images between 1 and 4 m at a 5-MHz modulation frequency. The depth inaccuracy is measured under 2% at 1 m and 4% at 4 m and is verified by noise analysis. -
dc.identifier.bibliographicCitation IEEE ELECTRON DEVICE LETTERS, v.31, no.11, pp.1272 - 1274 -
dc.identifier.doi 10.1109/LED.2010.2066254 -
dc.identifier.issn 0741-3106 -
dc.identifier.scopusid 2-s2.0-78049298179 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/12305 -
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5560722 -
dc.identifier.wosid 000283448300033 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title A 3-D Time-of-Flight CMOS Image Sensor with Pinned-Photodiode Pixel Structure -
dc.type Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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