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오윤석

Oh, Yoon Seok
Laboratory for Strong Correlation in Quantum Materials
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dc.citation.endPage 725 -
dc.citation.number 5-9 -
dc.citation.startPage 721 -
dc.citation.title PHYSICA B-CONDENSED MATTER -
dc.citation.volume 403 -
dc.contributor.author Kim, Kee Hoon -
dc.contributor.author Oh, Yoon Seok -
dc.contributor.author Sharma, PA -
dc.contributor.author Harrison, N -
dc.contributor.author Amitsuka, H -
dc.contributor.author Mydosh, JA -
dc.date.accessioned 2023-12-22T08:41:35Z -
dc.date.available 2023-12-22T08:41:35Z -
dc.date.created 2015-07-08 -
dc.date.issued 2008-04 -
dc.description.abstract We investigate the Hall coefficient RH, resistivity, and magnetization of URu2 Si2 and U (Ru0.96 Rh0.04)2 Si2 in the high field regime up to 45 T to trace the electronic structure changes in both high and low temperature regimes. We find that at high temperatures above {reversed tilde} 7 K, temperature- and field-dependent positions of RH maxima and magnetoresistance maxima coincide with a coherent temperature Tcoh at each field. These systematically decrease in temperatures with increasing fields and extrapolate to zero at the field-induced putative quantum critical point (QCP). This observation suggests a collapse of a new energy scale, i.e., a coherent temperature of a heavy quasiparticle band, at the putative field-induced QCP. At lower temperatures, we show there are discontinuous changes of the Hall number nH = 1 / RH e at the phase boundaries. This behavior illustrates that the phase formation is caused by first order reconstructions of the Fermi surface, which we interpret to the polarization of Fermi surface pockets seen in de-Haas van-Alphen (dHvA) measurements. © 2007 Elsevier B.V. All rights reserved. -
dc.identifier.bibliographicCitation PHYSICA B-CONDENSED MATTER, v.403, no.5-9, pp.721 - 725 -
dc.identifier.doi 10.1016/j.physb.2007.10.022 -
dc.identifier.issn 0921-4526 -
dc.identifier.scopusid 2-s2.0-39749176287 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/12074 -
dc.identifier.url http://www.sciencedirect.com/science/article/pii/S0921452607009052 -
dc.identifier.wosid 000254689900003 -
dc.language 영어 -
dc.publisher ELSEVIER SCIENCE BV -
dc.title Hall Effect Signatures of Electronic Structure Change near a Field Induced Quantum Critical Point in U(Ru1-xRhx)2Si2 -
dc.type Article -
dc.description.journalRegisteredClass scopus -

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