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Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Research Interests
  • Convergence between circuit and EM domains

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Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage Fluctuations

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dc.contributor.author Park, Eunkyeong ko
dc.contributor.author Kim, Hyungsoo ko
dc.contributor.author Shim, Jongjoo ko
dc.contributor.author Kim, Yong-Ju ko
dc.contributor.author Kim, Yun-Saing ko
dc.contributor.author Kim, Jingook ko
dc.date.available 2015-07-03T06:34:55Z -
dc.date.created 2015-07-03 ko
dc.date.issued 2015-08 ko
dc.identifier.citation IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.57, no.4, pp.796 - 806 ko
dc.identifier.issn 0018-9375 ko
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/11846 -
dc.description.abstract The jitter probability density function (PDF) at multistage output buffers due to supply voltage fluctuations is analytically derived. For experimental validation, an integrated circuit (IC) is designed, fabricated, and assembled in a printed circuit board (PCB). The on-chip supply voltage fluctuations are extracted from the simultaneous measurements at the pads on IC and PCB and used to calculate the jitter PDF of the multistage buffers. Also, characteristics of the output channels are measured and modeled with the separately designed channel pattern. Finally, the jitter PDFs for multistage buffers are calculated and compared with the measured jitter histograms ko
dc.description.statementofresponsibility close -
dc.language 영어 ko
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC ko
dc.title Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage Fluctuations ko
dc.type ARTICLE ko
dc.identifier.scopusid 2-s2.0-85027957586 ko
dc.identifier.wosid 000360015200023 ko
dc.type.rims ART ko
dc.description.wostc 0 *
dc.description.scopustc 0 *
dc.date.tcdate 2015-12-28 *
dc.date.scptcdate 2015-11-04 *
dc.identifier.doi 10.1109/TEMC.2015.2403294 ko
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7054512 ko
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