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Lee, Zonghoon
Atomic-Scale Electron Microscopy (ASEM) Lab
Research Interests
  • Advanced Transmission Electron Microscopy (TEM/STEM), in Situ TEM, graphene, 2D materials, low-dimensional crystals, nanostructured materials


Silicene on Other Two-dimensional Materials: Formation of Heterostructure

DC Field Value Language Kim, Jung Hwa ko Lee, Zonghoon ko 2015-01-16T00:07:05Z - 2015-01-15 ko 2014-12 ko
dc.identifier.citation APPLIED MICROSCOPY, v.44, no.4, pp.123 - 132 ko
dc.identifier.issn 2287-5123 ko
dc.identifier.uri -
dc.description.abstract Silicene is one of the most interesting two-dimensional materials, because of not only the extraordinary properties similar to graphene, but also easy compatibility with existing silicon-based devices. However, non-existing graphitic-like structure on silicon and unstable free-standing silicene structure leads to difficulty in commercialization of this material. Therefore, substrates are essential for silicene, which affects various properties of silicene and supporting unstable structure. For maintaining outstanding properties of silicene, van der Waals bonding between silicene and substrate is essential because strong interaction, such as silicene with metal, breaks the band structure of silicene. Therefore, we review the stability of silicene on other two-dimensional materials for van der Waals bonding. In addition, the properties of silicene are reviewed for silicene-based heterostructure. ko
dc.description.statementofresponsibility close -
dc.language 영어 ko
dc.publisher 한국현미경학회 ko
dc.title Silicene on Other Two-dimensional Materials: Formation of Heterostructure ko
dc.type ARTICLE ko
dc.type.rims ART ko
dc.identifier.doi 10.9729/AM.2014.44.4.123 ko
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