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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 3 | - |
dc.citation.number | 22 | - |
dc.citation.startPage | 1 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 86 | - |
dc.contributor.author | Park, Kibog | - |
dc.contributor.author | Ding, Y | - |
dc.contributor.author | Pelz, JP | - |
dc.contributor.author | Mikhov, MK | - |
dc.contributor.author | Wang, Y | - |
dc.contributor.author | Skromme, BJ | - |
dc.date.accessioned | 2023-12-22T10:36:44Z | - |
dc.date.available | 2023-12-22T10:36:44Z | - |
dc.date.created | 2014-11-10 | - |
dc.date.issued | 2005-05 | - |
dc.description.abstract | Finite-element calculations of Schottky diode capacitance-voltage (C-V) curves show that an array of subsurface inclined quantum wells (QWs) produce negligible change in shape and slope of C-V curves, but significantly reduce the intercept voltage. This is particularly important for hexagonal SiC, in which current- or process-induced cubic inclusions are known to behave as electron QWs. These calculations naturally explain the surprisingly large effect of cubic inclusions on the apparent 4H-SiC Schottky barrier determined by C-V measurements, and together with the measured C-V data indicate the QW subband energy in the inclusions to be ~0.51 eV below the host 4H-SiC conduction band. | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.86, no.22, pp.1 - 3 | - |
dc.identifier.doi | 10.1063/1.1935757 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.scopusid | 2-s2.0-20844455721 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/10072 | - |
dc.identifier.url | http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=20844455721 | - |
dc.identifier.wosid | 000229590100044 | - |
dc.language | 영어 | - |
dc.publisher | AMER INST PHYSICS | - |
dc.title | Effect of inclined quantum wells on macroscopic capacitance-voltage response of Schottky contacts: Cubic inclusions in hexagonal SiC | - |
dc.type | Article | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | STACKING-FAULTS | - |
dc.subject.keywordPlus | TRANSFORMATION | - |
dc.subject.keywordPlus | POLARIZATION | - |
dc.subject.keywordPlus | POLYTYPES | - |
dc.subject.keywordPlus | OXIDATION | - |
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