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Statistically Resolving Thickness-Dependent Electrical Characteristics in Multilayer-MoS2 Transistors File File

Lee, Sanghyun , Hong, Sumin , Park, Minho , Kim, Seongju , Baek, Sanghoon , Yang, Seonguk , Lee, Chang-Soo , Bae, Sang-Hoon , Suh, Joonki , Lee, Yongwoo , et al

Article Issue Date2026-04 View0
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