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A Proposed On-Die Oscilloscope for Monitoring of Power Noise Waveform Inside IC Due to Transient Stress Events File

Uulu, Zakirbek Mamatair , Cho, Jung-Hoon , Bae, Bumhee , Kim, Jingook

Article Issue Date2022-04 View187
Characterization and Application of Improved Oscilloscope IC for System Diagnosis of ESD and HPEM Effects File

Lee, Kyunghoon , Jeong, Sangyeong , Choi, Wooshin , Choi, Jung-Hwan , Kim, Jingook

Article Issue Date2024-12 View143
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