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Scalability of 28-nm Ternary CMOS Technology Using Halo Profile for Low-leakage and High-density SRAM File

Kim, Woo-Seok , Lee, Kwan Yong , Yeo, Sang Hun , Jang, In Jun , Choi, Young-Eun , Ryu, Min Woo , Kim, Kyung Rok

Article Issue Date2025-10 View24
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