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Electrical and physical characteristics for crystalline atomic layer deposited beryllium oxide thin film on Si and GaAs substrates File

Yum, J. H. , Akyol, T. , Lei, M. , Ferrer, D. A. , Hudnall, Todd W. , Downer, M. , Bielawski, C. W. , Bersuker, G. , Lee, J. C. , Banerjee, S. K.

Article Issue Date2012-01 View58
Reversible capacitance changes in the MOS capacitor with an ITO/CeO2/p-Si structure File

Park, Daehoon , Kim, Minju , Beom, Keonwon , Cho, Seong-Yong , Kang, Chi Jung , Yoon, Tae-Sik

Article Issue Date2019-05 View91
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