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Capacitance Matching for Stabilizing Negative Capacitance Effect in MOS Gate Stack Based on HfxZr1-xO2 Ferroelectric Thin Film

Wi, Sungjae , Park, Hyunjae , Kim, Jiwan , Jo, Jaehyeong , Kwun, Hyunmin , Park, Kibog

Conference Paper Issue Date2025-02-14 View10
Negative Capacitance Effects in HfₓZr₁₋ₓO₂ Based MIM Capacitor File

Wi, Sungjae

Thesis Issue Date2025-08 View56
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