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Mobility Overestimation in Thin-Film Transistors: Effects of Device Geometry and Fringe Currents File

Kim, Soohyun , Lee, Youngjoon , Shin, Seokyeon , Kim, Hyunsoo , Shin, Hyoseob , Hosono, Hideo , Jeong, Changwook , Kim, Junghwan

Article Issue Date2025-10 View37
Ultra-thin Oxide TFTs and Related Instabilities

Kim, Junghwan , Song, Minju , Kim, Soohyun , Shin, Hyoseob , Yeom, Jiho

Conference Paper Issue Date2024-10-08 View38
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