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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)TypeView
2015-11-12Characterization of Defects in 2D Materials at Atomic Scale using Aberration Corrected Transmission Electron Microscopy (invited talk)Lee, Zonghoon; Ryu, GyeongHee; Park, Hyo Ju; Kim, Jung Hwa; Kim, Na YeonCONFERENCE20
2015-03-26Synthesis of Wafer-scale Layer Controlled Molybdenum Disulfide using Atomic Layer DepositionLee, Zonghoon; Kim, Youngjun; Song, Jeong-Gyu; Ryu, GyeongHee; Hwang, Sung-Hwan; Lee, Chang Wan; Choi, Taejin; Woo, Wangje; Jung, Hanearl; Ko, Kyoung Young; Myoung, Jae-Min; Park, Yong Ju; Ahn, Jong-Hyun; Park, Jusang; Kim, HyungjunCONFERENCE20
Showing results 1 to 2 of 2

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