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Characterization of Thermal Stability and Unexpected Mobility Enhancement in IGZO FETs Measured up to 750°C. File

Nam, Kisoo , Niu, Chang , Jang, Hyeongjun , Park, Beomjin , Park, Yoonju , Lee, Youngjoon , Jeong, Changwook , Ye, Peide

Article Issue Date2026-03 View3
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