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Issue DateTitleAuthor(s)TypeView
2010-09The influence of sputtering power and O-2/Ar flow ratio on the performance and stability of Hf-In-Zn-O thin film transistors under illuminationKim, Hyun-Suk; Park, Kyung-Bae; Son, Kyoung Seok; Park, Joon Seok; Maeng, Wan-Joo; Kim, Tae Sang; Lee, Kwang-Hee; Kim, Eok Su; Lee, Jiyoul; Suh, Joonki; Seon, Jong-Baek; Ryu, Myung Kwan; Lee, Sang Yoon; Lee, Kimoon; Im, SeongilARTICLE164
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