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Batch Fabrication of AFM-Tip Integrated Disk Nanoelectrodes

Shin, Heungjoo , Moon, Jong-Seok , Mizaikoff, Boris , Kranz, Christine

Conference Paper Issue Date2006-11-02 View44
Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer level File

Shin, Heungjoo , Hesketh, Peter J. , Mizaikoff, Boris , Kranz, Christine

Article Issue Date2007-07 View98
Bitmap-assisted focused ion beam fabrication of combined atomic force scanning electrochemical Microscopy probes

Moon, Jong-Seok , Shin, Heungjoo , Mizaikoff, Boris , Kranz, Christine

Article Issue Date2007-09 View70
Frequency dependence of the electrochemical activity contrast in AC-scanning electrochemical microscopy and atomic force microscopy-AC-scanning electrochemical microscopy imaging File

Eckhard, Kathrin , Kranz, Christine , Shin, Heungjoo , Mizaikoff, Boris , Schuhmann, Wolfgang

Article Issue Date2007-07 View109
Ion Beam Induced Deposition of Platinum-Carbon Composite Electrodes for Bifunctional AFM-SECM Probes

Wiedemair, Justyna , Moon, Jong-Seok , Shin, Heungjoo , Mizaikoff, Boris , Kranza, C.

Conference Paper Issue Date2007-10-10 View44
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