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| Issue Date | Title | Author(s) | Type | View |
|---|---|---|---|---|
| 2010-03-15 | Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) study | Park, Kibog; Cai, W; Pelz, JP; Miao, MS; Lambrecht, WRL; Zhang, X; Skowronski, M; Capano, MA | CONFERENCE | 93 |
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