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Issue DateTitleAuthor(s)TypeView
2010-03-15Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) studyPark, Kibog; Cai, W; Pelz, JP; Miao, MS; Lambrecht, WRL; Zhang, X; Skowronski, M; Capano, MACONFERENCE93
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