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Analyzing the Contact-Doping Effect in In₂O₃ FETs: Unveiling the Mechanisms Behind the Threshold-Voltage Roll-Off in Oxide Semiconductor Transistors File

Lin, Jian-Yu , Niu, Chang , Lin, Zehao , Lee, Sumi , Kim, Taehyun , Lee, Jungho , Liu, Chang , Lu, Juanjuan , Wang, Haiyan , Alam, Muhammad Ashraful , et al

Article Issue Date2025-06 View140
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