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Direct observation of localized defect states in semiconductor nanotube junctions File

Kim, Hajin , Lee, J , Kahng, SJ , Son, YW , Lee, SB , Lee, CK , Ihm, J , Kuk, Y

Article Issue Date2003-05 View66
Time-Averaged Current Distribution for a Rotating‐Disk Electrode under Periodic Current Reversal Conditions File

Jeong, Kyeong-Min , Lee, CK , Sohn, HJ

Article Issue Date1992-07 View44
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