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Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors File

Lee, Jaewook , Jang, Jaeman , Kim, Hyeongjung , Lee, Jiyoul , Lee, Bang-Lin , Choi, Sung-Jin , Kim, Dong Myong , Kim, Dae Hwan , Kim, Kyung Rok

Article Issue Date2014-03 View125
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