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Browsing by Author : Lee, Yong Wook

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Micrometer x-ray diffraction study of VO2 films: Separation between metal-insulator transition and structural phase transition File

Kim, Bong-Jun , Lee, Yong Wook , Choi, Sungyeoul , Lim, Jung-Wook , Yun, Sun Jin , Kim, Hyun-Tak , Shin, Tae-Ju , Yun, Hwa-Sick

Article Issue Date2008-06 View119
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