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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)TypeView
2014-06Quantitative Evaluation of Dislocation Density in Epitaxial GaAs Layer on Si Using Transmission Electron MicroscopyKim, Kangsik; Lee, Jongyoung; Kim, Hyojin; Lee, ZonghoonARTICLE731
2015-05-29원자분해능 투과전자현미경을 이용한 단층 h-BN의 삼각형 결함 성장 메커니즘Lee, Zonghoon; Park, Hyo Ju; Ryu, Gyeong Hee; Lee, Jongyoung; Ryu, Junga; Park, Jinwoo; Hong, SeokryunCONFERENCE14
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