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Extream Near-Field Mode Pattern Scan for a TE02 Mode Converter Using the Electro-Optic Probe System

Choi, EunMi , Lee, DJ , Lee, IG

Conference Paper Issue Date2014-05-22 View70
On Board Testing of the Control System in LNG Carrier Using Dynamic Simulator

Chung, Jibum , Lee, IG , Kim, WB , You, HJ , Park, JW , Yun, YS , Koo, BC , Lee, JH

Conference Paper Issue Date1999 View88
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