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Correlated topographic and spectroscopic imaging beyond diffraction limit by atomic force microscopy metallic tip-enhanced near-field fluorescence lifetime microscopy File

Hu, DH , Micic, M , Klymyshyn, N , Suh, Yung Doug , Lu, HP

Article Issue Date2003-07 View134
Correlated topographic and spectroscopic imaging by combined atomic force microscopy and optical microscopy File

Hu, DH , Micic, M , Klymyshyn, N , Suh, Yung Doug , Lu, HP

Article Issue Date2004-05 View174
Finite element method simulation of the field distribution for AFM tip-enhanced surface-enhanced Raman scanning microscopy File

Micic, M , Klymyshyn, N , Suh, Yung Doug , Lu, HP

Article Issue Date2003-02 View91
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