or enter first few letters:
  • Sort by:
  • In order:
  • Results/Page
  • Authors/Record:

Showing results 1 to 20 of 23

Issue DateTitleAuthor(s)TypeView
2013-05A high resolution and high linearity 45 nm CMOS fully digital voltage sensor for low power applicationsRyu, Myunghwan; Kim, YoungminARTICLE666
2012-02A novel methodology for speeding up IC performance in 32nm FinFETNguyen, Hung Viet; Ryu, Myunghwan; Kim, YoungminARTICLE585
2014-10A performance analysis for interconnections of 3D ICs with frequency-dependent TSV model in S-parameterHan, Ki Jin; Lim, Younghyun; Kim, YoungminARTICLE601
2018-04A Theoretically Sound Approach to Analog Circuit SizingLim, Eunji; Choi, Jaehyouk; Kim, YoungminARTICLE244
2015-09A Wide Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology NodeChoi, Jaehyouk; Kang, Yesung; Kim, YoungminARTICLE811
2017-09Analysis and reduction of the voltage noise of multi-layer 3D IC with multi-paired power delivery networkKim, Seungwon; Kim, YoungminARTICLE245
2014-12Comprehensive Performance Analysis of Interconnect Variation by double and triple patterning lithography processesKim, Youngmin; Lee, Jaemin; Ryu, MyunghwanARTICLE559
2015-02Cryptography Engine Design for IEEE 1609.2 WAVE Secure Vehicle Communication using FPGAKim, Youngmin; Jeong, ChanbokMaster's thesis1609
2011-11Diffusion-rounded CMOS for improving both I-on and I-off characteristicsRyu, Myunghwan; Nguyen, Hung Viet; Kim, YoungminARTICLE621
2015-08Impacts of Trapezoidal Fin of 20-nm Double-Gate FinFET on the Electrical Characteristics of CircuitsRyu, Myunghwan; Kim, YoungminARTICLE485
2017-09In Situ Electrochemical Activation of Atomic Layer Deposition Coated MoS2 Basal Planes for Efficient Hydrogen Evolution ReactionKim, Youngmin; Jackson, David H. K.; Lee, Daewon; Choi, Min; Kim, Tae-Wan; Jeong, Soon-Yong; Chae, Ho-Jeong; Kim, Hyun Woo; Park, Noejung; Chang, Hyunju; Kuech, Thomas F.; Kim, Hyung JuARTICLE375
2020-01In situ electrochemically synthesized Pt-MoO3-x nanostructure catalysts for efficient hydrogen evolution reactionLee, Daewon; Kim, Youngmin; Kim, Hyun Woo; Choi, Min; Park, Noejung; Chang, Hyunju; Kwon, Youngkook; Park, Jong Hyeok; Kim, Hyung JuARTICLE103
2013-05Intra-gate length biasing for leakage optimization in 45nm technology nodeKang Yesung; Kim, YoungminARTICLE632
2015-08Inverted Layer-By-Layer Fabrication of an Ultraflexible and Transparent Ag Nanowire/Conductive Polymer Composite Electrode for Use in High-Performance Organic Solar CellsKim, Youngmin; Ryu, Tae In; Ok, Ki-Hoon; Kwak, Min-Gi; Park, Sungmin; Park, Nam-Gyu; Han, Chul Jong; Kim, Bong Soo; Ko, Min Jae; Son, Hae Jung; Kim, Jong-WoongARTICLE135
2016-07Novel adaptive power-gating strategy and tapered TSV structure in multilayer 3D ICKim, Seung Won; Kang, Seokhyeong; Han, Ki Jin; Kim, YoungminARTICLE695
2012-08Novel IC designs with 32 nm Independent-Gate FinFETKim, Youngmin; Nguyen, Hung VietMaster's thesis770
2015-06On-chip interconnect boosting technique by using of 10-nm double gate-all-around (DGAA) transistorLee, Jaemin; Ryu, Myunghwan; Kim, YoungminARTICLE495
2016-01Optimal inverter logic gate using 10-nm double gate-all-around (DGAA) transistor with asymmetric channel widthRyu, Myunghwan; Bien, Franklin; Kim, YoungminARTICLE677
2007-09Self-compensating design for reduction of timing and leakage sensitivity to systematic pattern-dependent variationGupta, Puneet; Kahng, Andrew B.; Kim, Youngmin; Sylvester, DennisARTICLE493
2013-08Simple and accurate modeling of the 3D structural variations in FinFETsKim, Youngmin; Kim, DonghuMaster's thesis817
Showing results 1 to 20 of 23