Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) | Type | View |
| 2014-02 | Atomic layer etching of BeO using BCl3/Ar for the interface passivation layer of III-V MOS devices | Min, K. S.; Kang, S. H.; Kim, J. K.; Yum, J. H.; Jhon, Y. I.; Hudnall, Todd W.; Bielawski, C. W.; Banerjee, S. K.; Bersuker, G.; Jhon, M. S.; Yeom, G. Y. | ARTICLE | 76 |
| 2013-05 | Gaussian mixture model-based classification of dynamic contrast enhanced MRI data for identifying diverse tumor microenvironments: preliminary results | Han, S. H.; Ackerstaff, E.; Stoyanova, R.; Carlin, S.; Huang, W.; Koutcher, J. A.; Kim, J. K.; Cho, G.; Jang, Gil-Jin; Cho, Hyungjoon | ARTICLE | 713 |
| 2007-10 | Unusual sensitivity of closed-loop phase Behavior to chain size and distribution | Hwang, Sung Wook; Kim, Eunhye; Shin, Changhak; Kim, Jung Hyun; Ryu, Du Yeol; Park, Soojin; Chang, T.; Kim, J. K. | ARTICLE | 589 |
Showing results 1 to 3 of 3
