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Atomic layer etching of BeO using BCl3/Ar for the interface passivation layer of III-V MOS devices File

Min, K. S. , Kang, S. H. , Kim, J. K. , Yum, J. H. , Jhon, Y. I. , Hudnall, Todd W. , Bielawski, C. W. , Banerjee, S. K. , Bersuker, G. , Jhon, M. S. , et al

Article Issue Date2014-02 View87
Gaussian mixture model-based classification of dynamic contrast enhanced MRI data for identifying diverse tumor microenvironments: preliminary results File

Han, S. H. , Ackerstaff, E. , Stoyanova, R. , Carlin, S. , Huang, W. , Koutcher, J. A. , Kim, J. K. , Cho, G. , Jang, Gil-Jin , Cho, Hyungjoon

Article Issue Date2013-05 View237
Unusual sensitivity of closed-loop phase Behavior to chain size and distribution File

Hwang, Sung Wook , Kim, Eunhye , Shin, Changhak , Kim, Jung Hyun , Ryu, Du Yeol , Park, Soojin , Chang, T. , Kim, J. K.

Article Issue Date2007-10 View111
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