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Browsing byAuthorJin, MY
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| Issue Date | Title | Author(s) | Type | View |
|---|---|---|---|---|
| 2001-04 | Residual stress behavior in methylsilsesquioxane-based dielectric thin films | Oh, W; Shin, Tae Joo; Ree, M; Jin, MY; Char, K | ARTICLE | 815 |
| 2002-03 | Residual stress evolution in dielectric thin films prepared from poly(methylsilsesquioxane) precursor | Oh, W; Shin, TJ; Ree, M; Jin, MY; Char, K | ARTICLE | 261 |
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