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Issue DateTitleAuthor(s)TypeView
2006Yield property characterization for Au and TiN thin films by applying nanoindentation techniqueLee, Yun-Hee; Huh, Yong-Hak; Kim, Ju-Young; Nahm, Seung-Hoon; Jang, Jae-il; Kwon, DongilARTICLE563
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