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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)TypeView
2011-07-05High sensitive NSOM with dithering sample stage for characterizing nano-materialsPark, Kyoung-Duck; Heo, Chaejeong; Lee, Hong Seok; Yim, Sang Youp; Lee, Young Hee; Jeong, Mun SeokCONFERENCE39
2012-09Sensitivity maximized near-field scanning optical microscope with dithering sample stagePark, Kyoung-Duck; Lee, Seung Gol; Heo, Chaejeong; Lee, Young Hee; Jeong, Mun SeokARTICLE293
Showing results 1 to 2 of 2

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