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Showing results 1 to 5 of 5

Issue DateTitleAuthor(s)TypeView
2004Ballistic electron emission microscopy study of p-type 4H-SiCDing, Y; Park, Kibog; Pelz, JP; Los, AV; Mazzola, MSARTICLE641
2004-07Cubic inclusions in 4H-SIC studied with ballistic electron-emission microscopyDing, Y; Park, Kibog; Pelz, JP; Palle, KC; Mikhov, MK; Skromme, BJARTICLE606
2005-05Effect of inclined quantum wells on macroscopic capacitance-voltage response of Schottky contacts: Cubic inclusions in hexagonal SiCPark, Kibog; Ding, Y; Pelz, JP; Mikhov, MK; Wang, Y; Skromme, BJARTICLE661
2019-06-17NTIRE 2019 Challenge on Video Super-Resolution: Methods and ResultsNah, Seungjun; Timofte, Radu; Gu, Shuhang; Baik, Sungyong; Hong, Seokil; Moon, Gyeongsik; Son, Sanghyun; Lee, Kyoung Mu; Wang, Xintao; Chan, Kelvin C.K.; Yu, Ke; Dong, Chao; Loy, Chen Change; Fan, Yuchen; Yu, Jiahui; Liu, Ding; Huang, Thomas S.; Liu, Xiao; Li, Chao; He, Dongliang; Ding, Y; Wen, Shilei; Porikli, Fatih; Kalarot, Ratheesh; Haris, Muhammad; Shakhnarovich, Greg; Ukita, Norimichi; Yi, Peng; Wang, Zhongyuan; Jiang, Kui; Jiang, Junjun; Ma, Jiayi; Dong, Hang; Zhang, Xinyi; Hu, Zhe; Kim, Kwanyoung; Kang, Dong Un; Chun, Se Young; Purohit, Kuldeep; Rajagopalan, AN; Tian, Yapeng; Zhang, Yulun; Fu, Yun; Xu, Chenliang; Tekalp, AM; Yilmaz, M. Akin; Korkmaz, Cansu; Sharma, Manoj; Makwana, Megh; Badhwar, Anuj; Singh, Ajay Pratap; Upadhyay, Avinash; Mukhopadhyay, Rudrabha; Shukla, Ankit; Khanna, Dheeraj; Mandal, A.S.; Chaudhury, Santanu; Miao, Si; Zhu, Yongxin; Huo, XiaoCONFERENCE29
2004-01Quantum well state of self-forming 3C-SiC inclusions in 4H SiC determined by ballistic electron emission microscopyDing, Y; Park, Kibog; Pelz, JP; Palle, KC; Mikhov, MK; Skromme, BJ; Meidia, H; Mahajan, SARTICLE525
Showing results 1 to 5 of 5

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