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Impact of BTBT, stress and interface charge on optimum Ge in SiGe pMOS for low power applications File

Dhar, S. , Noh, H.K. , Kim, S.J. , Kim, H.W. , Wu, Z. , Lee, W.S. , Bhuwalka, K.K. , Kim, J.C. , Jeong, Changwook , Kwon, U.H. , et al

Conference Paper Issue Date2016-10-20 View27
Physical understanding of alloy scattering in SiGe channel for high-performance strained pFETs File

Jeong, Changwook , Park, H.-H. , Dhar, S. , Park, S. , Lee, K. , Jin, S. , Choi, W. , Kwon, U.-H. , Lee, K.-H. , Park, Y.

Conference Paper Issue Date2013-12-09 View24
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