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Non-arrhenius behavior in lifetime estimation during highly accelerated lifetime test for multilayer ceramic capacitors File

Chun, Jinsung , Lee, Kutak , Lee, Geon-Ju , Lee, Ju-Hyeon , Hong, Chang-Hyo , Yoon, Seok-Hyun , Choi, Jae Yeol , Jo, Wook

Article Issue Date2024-03 View25
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