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Flaw-Containing Alumina Hollow Nanostructures Have Ultrahigh Fracture Strength To Be Incorporated into High-Efficiency GaN Light-Emitting Diodes File

Kang, Sung-gyu , Moon, Daeyoung , Jang, Jeonghwan , Kim, Ju-Young , Suh, Jin-Yoo , Yoon, Euijoon , Han, Heung Nam , Choi, In-suk

Article Issue Date2018-02 View25
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