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Issue Date | Title | Author(s) | Type | View |
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2010-06 | Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices | Lee, Jung-Kyu; Jeong, Hu Young; Cho, In-Tak; Lee, Jeong Yong; Choi, Sung-Yool; Kwon, Hyuck-In; Lee, Jong-Ho | ARTICLE | 621 |