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A Cost-Effective Structure for Secondary Discharge Control to Improve System-Level ESD Immunity of a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Article Issue Date2020-02 View3

A Customized Integrated Circuit for Active EMI Filter With High Reliability and Scalability File

Jeong, Sangyeong , Park, Junsik , Kim, Jingook

Article Issue Date2021-11 View14

A Low-Voltage Microwave Plasma Ionizer without the ESD Risk due to a High Voltage Source

Bae, Byoungjin , Park, Junsik , Kim, Jingook

Conference Paper Issue Date2019-09-17 View8

A proto-type ESD generator for system immunity test of wearable devices File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byoungsu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View7

An On-die Oscilloscope for System-Level ESD Noise Monitoring File

Lee, Wooryong , Park, Junsik , Kim, Jingook , Ryu, Chunghyun , Lee, Jongsung , Kang, Bonggyu , Bae, Bumhee

Conference Paper Issue Date2019-07-22 View9

Calculation and Measurement of System-Level ESD Coupling

Park, Junsik , Kim, Jingook

Conference Paper Issue Date2015-11-24 View5

Efficient Calculation of EMI Factors from Power Distribution Network using Cavity Resonance Circuit Model File

Shin, Dongil , Park, Junsik , Kim, Namsu , Lee, Jongjoo , Park, Youngwoo , Kim, Jingook

Conference Paper Issue Date2015-12-15 View1

Efficient Calculation of ESD Inductive Coupling on a Conductor Loop Using PEEC Method File

Kim, Jingook , Park, Junsik , Lee, Jongsung , Seol, Byongsu

Conference Paper Issue Date2014-08-03 View5

Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC Method File

Park, Junsik , Lee, Jongsung , Seol, Byongsu , Kim, Jingook

Article Issue Date2015-08 View7

Electromagnetic Simulations of a Neuromorphic Hardware using PEEC and Memristor SPICE Models File

Lee, Wooryong , Park, Junsik , Kim, Jingook

Conference Paper Issue Date2017-12-16 View1

Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition File

Park, Junsik , Lee, Jongsung , Seol, Byongsu , Kim, Jingook

Article Issue Date2017-01 View3

Fast Calculation of System-Level ESD Noise Coupling to a Microstrip Line Using PEEC Method File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2015-12-15 View5

Field source extraction of an ESD generator and its application to system-level ESD analysis in a solid-state storage system File

Park, Junsik , Lee, Wooryong , Kim, Namsu , Kang, Bonggyu , Ryu, Chunghyun , Lee, Jongsung , Jo, Cheolgu , Kim, Jingook

Article Issue Date2021-06 View4

IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Byongsu Seol , Kim, Jingook

Article Issue Date2017-12 View4

Measurement and Analysis of Statistical IC Operation Errors in a Memory Module Due to System-Level ESD Noise File

Park, Myungjoon , Park, Junsik , Choi, Jongcheul , Kim, Jinwoo , Jeong, Seonghoon , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Article Issue Date2019-02 View2

Measurement and analysis of system-level ESD-indauced soft failures of a sense amplifier flip-flop with pseudo differential inputs File

Jeong, Myeongjo , Park, Junsik , Kim, Jinwoo , Seung, Manho , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2018-09-23 View11

Measurement and Modeling of Noise Coupling and IC Failure due to System-level ESD Event File

Park, Junsik

Thesis Issue Date2019-08 View9

Measurement and Modeling of System-level ESD Noise Voltages in Real Mobile Products File

Park, Myungjoon , Park, Junsik , Seung, Manho , Choi, Joungcheul , Lee, Changyeol , Lee, Seokkiu , Kim, Jingook

Conference Paper Issue Date2016-05-17 View1

Measurement of Discharging Currents through an IC due to the Charged Board Event Using a Shielded Rogowski Coil File

Park, Junsik , Lee, Jongsung , Kim, Seongmoo , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2016-09-11 View5

System-level ESD Noise induced by Secondary Discharges at Voltage Suppressor Devices in a Mobile Product File

Park, Junsik , Lee, Jongsung , Jo, Cheolgu , Seol, Byongsu , Kim, Jingook

Conference Paper Issue Date2017-06-21 View11

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