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Kwon, Daeil (권대일)

Department
School of Mechanical, Aerospace and Nuclear Engineering(기계항공및원자력공학부)
Research Interests
Reliability, Prognostics and Health Management, Non-destructive Test
Lab
IoT-based System Reliability Lab
E-Mail
dkwon@unist.ac.kr
Website
http://isr.unist.ac.kr
This table browses all dspace content
Issue DateTitleAuthor(s)TypeViewAltmetrics
201802Early identification of emerging technologies: A machine learning approach using multiple patent indicatorsLee, Changyong; Kwon, Ohjin; Kim, Myeongjung, et alARTICLE105 Early identification of emerging technologies: A machine learning approach using multiple patent indicators
201709Effect of humidity changes on dimensional stability of 3D printed parts by selective laser sinteringKwon, Daeil; Park, Eunju; Ha, Sangho, et alARTICLE105 Effect of humidity changes on dimensional stability of 3D printed parts by selective laser sintering
201708Reliability Assessment of Low-Power Processors in Supercomputing Systems Shin, Insun; Kwon, DaeilARTICLE26 Reliability Assessment of Low-Power Processors in Supercomputing Systems
201707Industry 4.0: A Special Section in IEEE AccessSu, Shun-Feng; Rudas, Imre J.; Zurada, Jacek M., et alARTICLE59 Industry 4.0: A Special Section in IEEE Access
201706고온히터 솔더접합부의 신뢰성 평가 및 예측박은주; 권대일; 사윤기ARTICLE37 고온히터 솔더접합부의 신뢰성 평가 및 예측
201701A DIGITAL TECHNIQUE FOR DIAGNOSING INTERCONNECT DEGRADATION BY USING DIGITAL SIGNAL CHARACTERISTICSLee, Jinwoo; Kwon, DaeilARTICLE219 A DIGITAL TECHNIQUE FOR DIAGNOSING INTERCONNECT DEGRADATION BY USING DIGITAL SIGNAL CHARACTERISTICS
201610A model-based prognostic approach to predict interconnect failure using impedance analysisKwon, Daeil; Yoon, JeongahARTICLE261 A model-based prognostic approach to predict interconnect failure using impedance analysis
201607IoT-Based Prognostics and Systems Health Management for Industrial ApplicationsKwon, Daeil; Hodkiewicz, Melinda; Fan, Jiajie, et alARTICLE295 IoT-Based Prognostics and Systems Health Management for Industrial Applications
201606슈퍼컴퓨터에 사용되는 저전력 프로세서 패키지의 신뢰성 평가Park, Ju-Young; Kwon, Daeil; Nam, DukyunARTICLE228 슈퍼컴퓨터에 사용되는 저전력 프로세서 패키지의 신뢰성 평가
201601Detection of Failure Precursors in Multilayer Ceramic Capacitors Based on Symbolic Time Series AnalysisPark, Juyoung; Kwon, DaeilARTICLE281 Detection of Failure Precursors in Multilayer Ceramic Capacitors Based on Symbolic Time Series Analysis
201511Remaining-Life Prediction of Solder Joints Using RF Impedance Analysis and Gaussian Process RegressionKwon, Daeil; Azarian, Michael H; Pecht, MichaelARTICLE344 Remaining-Life Prediction of Solder Joints Using RF Impedance Analysis and Gaussian Process Regression
201506Optimal Interval Censoring Design for Reliability Prediction of Electronic PackagesKwon, Daeil; Shin, InsunARTICLE343 Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages
201309Failure Prediction of Multilayer Ceramic Capacitors (MLCCs) under Temperature-Humidity-Bias Testing Conditions Using Non-Linear ModelingKwon, Daeil; Azarian, Michael H.; Pecht, MichaelARTICLE317 Failure Prediction of Multilayer Ceramic Capacitors (MLCCs) under Temperature-Humidity-Bias Testing Conditions Using Non-Linear Modeling
201105Nondestructive Sensing of Interconnect Failure Mechanisms Using Time-Domain ReflectometryKwon, Daeil; Azarian, Michael H.; Pecht, MichaelARTICLE345 Nondestructive Sensing of Interconnect Failure Mechanisms Using Time-Domain Reflectometry
201009Prognostics of interconnect degradation using RF impedance monitoring and sequential probability ratio testKwon, Daeil; Azarian, M.H.; Pecht, M.ARTICLE464
200906Early Detection of Interconnect Degradation by Continuous Monitoring of RF ImpedanceKwon, Daeil; Azarian, Michael H.; Pecht, MichaelARTICLE337 Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance
1A Dimensional Compensation Algorithm for Vertical Bending Deformation of 3D printed Parts in Selective Laser SinteringHa, Sangho; Ransikarbum, Kasin; Han, Hweeyoung, et alARTICLE75

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