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사진

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Kim, Jingook (김진국)

Department
School of Electrical and Computer Engineering(전기전자컴퓨터공학부)
Research Interests
Convergence between circuit and EM domains
Lab
Integrated Circuit and Electromagnetic Compatibility Laboratory (IC & EMC Lab)
Website
http://icemclab.unist.ac.kr/
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Issue DateTitleAuthor(s)TypeViewAltmetrics
201810Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter ChainsKim, Heegon; Kim, Jingook; Fan, Jun, et alARTICLE107 Precise Analytical Model of Power Supply Induced Jitter Transfer Function at Inverter Chains
201808Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage ImmunityShin, Dongil; Jeong, Sangyeong; Kim, JingookARTICLE136 Quantified Design Guidelines of a Compact Transformerless Active EMI Filter for Performance, Stability, and High Voltage Immunity
201804Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application ProcessorKwak, Kyungjin; Kim, Jaehyuk; Kim, JingookARTICLE239 Near-Field Validation of Dipole-Moment Model Extracted From GTEM Cell Measurements and Application to a Real Application Processor
201712IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC PinsPark, Junsik; Lee, Jongsung; Jo, Cheolgu, et alARTICLE145 IC Failure Analysis Due to Charged Board Events by Measurements and Modeling of Discharging Currents Through IC Pins
201712Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE1666 Sensitivity Analysis of a Circuit Model for Power Distribution Network in a Multilayered Printed Circuit Board
201710An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain MeasurementJeong, Sangyeong; Kim, Mina; Jung, Jee-Hoon, et alARTICLE211 An Effective Experimental Optimization Method for Wireless Power Transfer System Design Using Frequency Domain Measurement
201704Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution NetworksShin, Dongil; Kim, Namsu; Lee, Jongjoo, et alARTICLE315 Quantified Design Guides for the Reduction of Radiated Emissions in Package-Level Power Distribution Networks
201701Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model DecompositionPark, Junsik; Lee, Jongsung; Seol, Byongsu, et alARTICLE246 Fast and Accurate Calculation of System-Level ESD Noise Coupling to a Signal Trace by PEEC Model Decomposition
201701Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended BuffersKim, JingookARTICLE172 Statistical Analysis for Pattern-Dependent Simultaneous Switching Outputs (SSO) of Parallel Single-Ended Buffers
201611High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibrationJeong, Jongwoo; Kim, Jingook; Kang, No-Weon, et alARTICLE299 High-frequency testing of vertical interconnection array using indirect contact probing method with an improved calibration
201606Formulation and Network Model Reduction for Analysis of the Power Distribution Network in a Production-Level Multilayered Printed Circuit BoardShringarpure, Ketan; Pan, Siming; Kim, Jingook, et alARTICLE162 Formulation and Network Model Reduction for Analysis of the Power Distribution Network in a Production-Level Multilayered Printed Circuit Board
2016A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noiseYoon C.; Kim, Jingook; Kim, Sukjin, et alARTICLE147 A slope and amplitude controllable triangular-current generator for the injection of a broad-band PDN noise
201508Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-EmbeddingYoon, Changwook; Tsiklauri, Mikheil; Zvonkin, Mikhail, et alARTICLE689 Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding
201508Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC MethodPark, Junsik; Lee, Jongsung; Seol, Byongsu, et alARTICLE467 Efficient Calculation of Inductive and Capacitive Coupling Due to Electrostatic Discharge (ESD) Using PEEC Method
201508An Enhanced Statistical Analysis Method for I/O Links Considering Supply Voltage Fluctuations and Inter-Symbol-InterferenceKim, Jingook; Lee, Jongjoo; Park, Eunkyeong, et alARTICLE291 An Enhanced Statistical Analysis Method for I/O Links Considering Supply Voltage Fluctuations and Inter-Symbol-Interference
201508Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage FluctuationsPark, Eunkyeong; Kim, Hyungsoo; Shim, Jongjoo, et alARTICLE427 Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage Fluctuations
201508Analysis and Design Guide of Active EMI Filter in a Compact Package for Reduction of Common-Mode Conducted EmissionsShin, Dongil; Kim, Sungnam; Park, Jaesu, et alARTICLE565 Analysis and Design Guide of Active EMI Filter in a Compact Package for Reduction of Common-Mode Conducted Emissions
201504Common Mode Noise Reduction for an LLC Resonant Converter by Using Passive Noise CancellationHan, Ki Jin; Ryu, Younggon; Kim, Sungnam, et alARTICLE451 Common Mode Noise Reduction for an LLC Resonant Converter by Using Passive Noise Cancellation
201501Indirect Contact Probing Method for Characterizing Vertical Interconnections in Electronic PackagingJeong, Jongwoo; Kim, Jingook; Kang, No-Weon, et alARTICLE409 Indirect Contact Probing Method for Characterizing Vertical Interconnections in Electronic Packaging
201412Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution NetworkKim, Jingook; Lee, Jongjoo; Ahn, Seungyoung, et alARTICLE401 Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

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