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Choi, Jaesik
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dc.citation.endPage 1403 -
dc.citation.number 9 -
dc.citation.startPage 1400 -
dc.citation.title IEEE SIGNAL PROCESSING LETTERS -
dc.citation.volume 22 -
dc.contributor.author Choi, Jaesik -
dc.contributor.author Jang, Gil-Jin -
dc.contributor.author Jeong, Kyungjoong -
dc.date.accessioned 2023-12-22T00:46:49Z -
dc.date.available 2023-12-22T00:46:49Z -
dc.date.created 2015-01-02 -
dc.date.issued 2015-09 -
dc.description.abstract In many image processing and computer vision problems, including face detection, local structure patterns such as local binary patterns (LBP) and modified census transform (MCT) have been adopted in widespread applications due to their robustness against illumination changes. However, being reliant on the local differences between neighboring pixels, they are inevitably sensitive to noise. To overcome the problem of noise-vulnerability of the conventional local structure patterns, we propose semi-local structure patterns (SLSP), a novel feature extraction method based on local region-based differences. The SLSP is robust to illumination variations, distortion, and sparse noise because it encodes the relative sizes of the central region with locally neighboring regions into a binary code. The principle of SLSP leads noise-robust expansions of LBP and MCT feature extraction frameworks. In a statistical analysis, we find that the proposed methods transform a substantial amount of random noise patterns in face images into more meaningful uniform patterns. The empirical results on the MIT+CMU dataset and FDDB (face detection dataset and benchmark) show that the proposed semi-local patterns applied to LBP and MCT feature extraction frameworks outperform the conventional LBP and MCT features in AdaBoost-based face detectors, with much higher detection rates. -
dc.identifier.bibliographicCitation IEEE SIGNAL PROCESSING LETTERS, v.22, no.9, pp.1400 - 1403 -
dc.identifier.doi 10.1109/LSP.2014.2372762 -
dc.identifier.issn 1070-9908 -
dc.identifier.scopusid 2-s2.0-84924692310 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/9787 -
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6963353 -
dc.identifier.wosid 000358598800010 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Semi-Local Structure Patterns for Robust Face Detection -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic -
dc.relation.journalResearchArea Engineering -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor AdaBoost -
dc.subject.keywordAuthor distortion -
dc.subject.keywordAuthor face detection -
dc.subject.keywordAuthor local binary patterns -
dc.subject.keywordAuthor semi-local structure patterns -

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