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- Kwon, Oh Hoon
- Ultrafast Laser Spectroscopy and Nano-microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Microscopy and Microanalysis 2018 | - |
| dc.contributor.author | Kim, Ye‐Jin | - |
| dc.contributor.author | Kwon, Oh Hoon | - |
| dc.date.accessioned | 2024-02-01T01:37:41Z | - |
| dc.date.available | 2024-02-01T01:37:41Z | - |
| dc.date.created | 2018-12-18 | - |
| dc.date.issued | 2018-08-07 | - |
| dc.identifier.bibliographicCitation | Microscopy and Microanalysis 2018 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/81077 | - |
| dc.language | 영어 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | Use of a Direct Electron-Detection Camera in Ultrafast Electron Microscopy for Low Dose Rate Time-Resolved Imaging | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2018-08-05 | - |
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