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A 0.5V-VIN, 0.29ps-Transient-FOM, and Sub-2mV-Accuracy Adaptive-Sampling Digital LDO Using Single-VCO-Based Edge-Racing Time Quantizer

Author(s)
Lee, JeonghyunBang, JooeunLim, YounghyunChoi, Jaehyouk
Issued Date
2019-06-09
DOI
10.23919/VLSIC.2019.8777999
URI
https://scholarworks.unist.ac.kr/handle/201301/79691
Fulltext
https://ieeexplore.ieee.org/document/8777999
Citation
33rd Symposium on VLSI Circuits, VLSI Circuits 2019, pp.C130 - C131
Abstract
This work presents a digital LDO using a single-VCO-based edge-racing (SVER) time quantizer to achieve fast transient and high accuracy concurrently. As the SVER scales the sampling frequency dynamically according to the magnitude of the error in the output voltage, the transient response can be improved without the increase in the power consumption in the steady state. Since the SVER uses a single VCO, the accuracy of the output can be high against local mismatches. In measurement, this LDO achieved a 0.29 ps-transient FOM and a sub-2 mV accuracy under 0.5-V supply.
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISSN
0000-0000

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