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Lee, Jongeun
Intelligent Computing and Codesign Lab.
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dc.citation.conferencePlace US -
dc.citation.conferencePlace Storrs, CT, USA -
dc.citation.endPage 276 -
dc.citation.startPage 269 -
dc.citation.title IEEE International Conference on Computer Design -
dc.contributor.author Lee, Sugil -
dc.contributor.author Fouda, Mohammed -
dc.contributor.author Lee, Jongeun -
dc.contributor.author Eltawil, Ahmed -
dc.contributor.author Kurdahi, Fadi -
dc.date.accessioned 2024-01-31T21:10:25Z -
dc.date.available 2024-01-31T21:10:25Z -
dc.date.created 2022-01-06 -
dc.date.issued 2021-10-24 -
dc.description.abstract To overcome the programming variability (PV) of ReRAM crossbar arrays (RCAs), the most common method is program-verify, which, however, has high energy and latency overhead. In this paper we propose a very fast and low-cost method to mitigate the effect of PV and other variability for RCA-based DNN (Deep Neural Network) accelerators. Leveraging the statistical properties of DNN output, our method called Online Batch-Norm Correction (OBNC) can compensate for the effect of programming and other variability on RCA output without using on-chip training or an iterative procedure, and is thus very fast. Also our method does not require a nonideality model or a training dataset, hence very easy to apply. Our experimental results using ternary neural networks with binary and 4-bit activations demonstrate that our OBNC can recover the baseline performance in many variability settings and that our method outperforms a previously known method (VCAM) by large margins when input distribution is asymmetric or activation is multi-bit. -
dc.identifier.bibliographicCitation IEEE International Conference on Computer Design, pp.269 - 276 -
dc.identifier.doi 10.1109/iccd53106.2021.00051 -
dc.identifier.issn 1063-6404 -
dc.identifier.scopusid 2-s2.0-85123953511 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/76796 -
dc.identifier.url https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9643837 -
dc.identifier.wosid 000763821700040 -
dc.publisher IEEE -
dc.title Fast and Low-Cost Mitigation of ReRAM Variability for Deep Learning Applications -
dc.type Conference Paper -
dc.date.conferenceDate 2021-10-24 -

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