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- Kim, Sungil
- Data Analytics Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | 2023 IISE Annual Conference & Expo | - |
| dc.contributor.author | Mun, Jong Hwan | - |
| dc.contributor.author | Yoo, Jitae | - |
| dc.contributor.author | Kim, Heesun | - |
| dc.contributor.author | Kim, Sungil | - |
| dc.date.accessioned | 2024-01-31T19:05:56Z | - |
| dc.date.available | 2024-01-31T19:05:56Z | - |
| dc.date.created | 2023-10-09 | - |
| dc.date.issued | 2023-05-21 | - |
| dc.identifier.bibliographicCitation | 2023 IISE Annual Conference & Expo | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/74731 | - |
| dc.publisher | Institute of Industrial and Systems Engineers | - |
| dc.title | Domain Knowledge-Informed Functional Outlier Detection for Line Quality Control Systems | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2023-05-19 | - |
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