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Jo, Wook
Sustainable Functional Ceramics Lab.
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dc.citation.endPage 233 -
dc.citation.number 3 -
dc.citation.startPage 229 -
dc.citation.title ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES -
dc.citation.volume 63 -
dc.contributor.author Jo, Wook -
dc.contributor.author Park, Chan -
dc.contributor.author Kim, Doh-Yeon -
dc.date.accessioned 2023-12-22T09:36:10Z -
dc.date.available 2023-12-22T09:36:10Z -
dc.date.created 2014-10-20 -
dc.date.issued 2007-04 -
dc.description.abstract The composition planes of the inversion boundary induced by the addition of Sb2O3 to ZnO ceramics were analyzed crystallographically by the application of electron back-scattered diffraction (EBSD) analysis and stereographic projection techniques. The inversion boundary was determined to consist of three discrete composition planes, {0001}, {101̄1}, {101̄0}. -
dc.identifier.bibliographicCitation ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, v.63, no.3, pp.229 - 233 -
dc.identifier.doi 10.1107/S0108767307000748 -
dc.identifier.issn 2053-2733 -
dc.identifier.scopusid 2-s2.0-34247351606 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/7446 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=34247351606 -
dc.identifier.wosid 000247908400001 -
dc.language 영어 -
dc.publisher WILEY-BLACKWELL -
dc.title Characterization of pyramidal inversion boundaries in Sb2O 3-doped ZnO by using electron back-scattered diffraction (EBSD) -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus PERCENT PBTIO3 CERAMICS -
dc.subject.keywordPlus ABNORMAL GRAIN-GROWTH -
dc.subject.keywordPlus ZINC-OXIDE -
dc.subject.keywordPlus ANTIPHASE BOUNDARIES -
dc.subject.keywordPlus MOL-PERCENT -
dc.subject.keywordPlus LAYERS -
dc.subject.keywordPlus TWIN -
dc.subject.keywordPlus BEHAVIOR -
dc.subject.keywordPlus BATIO3 -
dc.subject.keywordPlus GAAS -

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