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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 115 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 97 | - |
dc.citation.title | JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES | - |
dc.citation.volume | 45 | - |
dc.contributor.author | Choi, Hong Eun | - |
dc.contributor.author | Choi, EunMi | - |
dc.date.accessioned | 2024-01-30T14:05:16Z | - |
dc.date.available | 2024-01-30T14:05:16Z | - |
dc.date.created | 2024-01-23 | - |
dc.date.issued | 2024-02 | - |
dc.description.abstract | We proposed a newly devised method for measuring the complex permittivity of high-loss materials at the millimeter wave frequency range. In this paper, we employed a geometrical gap between samples, which allows us to evaluate the complex permittivity of high-loss materials. By introducing this gap, we obtain a characteristic shape of the transmittance, which enables us to fit the data and obtain a more precise complex permittivity value. The proposed method has been supported by experimental results with a very low error bar compared to the existing fundamental transmission line method. We measured diverse samples including alumina, Teflon, Vero family, and AlN-SiC, and confirmed that the proposed gap method achieves much higher precision than the existing method by 3 to over 10 times. Particularly for high-loss materials like the AlN-SiC sample, the average error of the relative permittivity evaluated by the existing transmission line method is 2.05% whereas the error by the proposed method is 0.05%. Moreover, the average error of the loss tangent measured by the existing method and the suggested method is 1.85% and 0.3%, respectively, which confirms the superiority of the proposed method. | - |
dc.identifier.bibliographicCitation | JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES, v.45, no.1-2, pp.97 - 115 | - |
dc.identifier.doi | 10.1007/s10762-023-00958-7 | - |
dc.identifier.issn | 1866-6892 | - |
dc.identifier.scopusid | 2-s2.0-85181216245 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/74396 | - |
dc.identifier.wosid | 001132593100002 | - |
dc.language | 영어 | - |
dc.publisher | SPRINGER | - |
dc.title | High-Precision Complex Permittivity Measurement of High Loss Dielectric Materials Using a Geometrical Gap in Millimeter Wave Frequency | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic; Optics; Physics, Applied | - |
dc.relation.journalResearchArea | Engineering; Optics; Physics | - |
dc.type.docType | Article; Early Access | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Permittivity measurement | - |
dc.subject.keywordAuthor | Permittivity | - |
dc.subject.keywordAuthor | Dielectric materials | - |
dc.subject.keywordAuthor | Transmission line | - |
dc.subject.keywordPlus | SUBSTRATE | - |
dc.subject.keywordPlus | 6G | - |
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