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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Kwon, Daeil | - |
| dc.contributor.author | Yoon, Jeong-ah | - |
| dc.date.accessioned | 2024-01-24T16:57:46Z | - |
| dc.date.available | 2024-01-24T16:57:46Z | - |
| dc.date.issued | 2016-02 | - |
| dc.description.degree | Master | - |
| dc.description | Department of Human and Systems Engineering | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/71971 | - |
| dc.identifier.uri | http://unist.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000002236116 | - |
| dc.language | eng | - |
| dc.publisher | Ulsan National Institute of Science and Technology | - |
| dc.rights.embargoReleaseDate | 9999-12-31 | - |
| dc.rights.embargoReleaseTerms | 9999-12-31 | - |
| dc.title.alternative | An Approach to Assess Solder Interconnect Degradation Using Digital Signal | - |
| dc.title | An Approach to Assess Solder Interconnect Degradation Using Digital Signal | - |
| dc.type | Thesis | - |
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