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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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품질 측정 장치, 이의 측정 방법 및 이의 기록매체

Author(s)
정상영김진국
Application Date
2019-10-07
Registration Date
2021-08-26
Application No.
10-2019-0123971
Publication No.
10-2296971
URI
https://scholarworks.unist.ac.kr/handle/201301/69030 Go to Link

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