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- Yoon, Tae-Sik
- Nano Semiconductor Research Lab.
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Charge-Storage-Based vs. Non-Charge-Storage-Based 1T Non-Volatile Memory through the Interaction between Oxide Semiconductor Channel and Gate Oxide Layer
- Author(s)
- Han, Jimin, Jeong, Boyoung, Noh, Taeyun, Yoon, Tae-Sik
- Issued Date
- 2023-03-08
- Citation
- 7th IEEE Electron Devices Technology and manufacturing (EDTM) Conference 2023, pp.26F-5
- Publisher
- IEEE
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