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Yoon, Tae-Sik
Nano Semiconductor Research Lab.
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dc.citation.conferencePlace KO -
dc.citation.endPage P-033 -
dc.citation.startPage P-033 -
dc.citation.title 7th IEEE Electron Devices Technology and manufacturing (EDTM) Conference 2023 -
dc.contributor.author Ko, Hanju -
dc.contributor.author Park, Kitae -
dc.contributor.author Moon, Sola -
dc.contributor.author Ryu, Jiyeon -
dc.contributor.author Sahu, Dwipak Prasad -
dc.contributor.author Yoon, Tae-Sik -
dc.date.accessioned 2023-12-20T10:35:10Z -
dc.date.available 2023-12-20T10:35:10Z -
dc.date.created 2023-12-19 -
dc.date.issued 2023-03-09 -
dc.identifier.bibliographicCitation 7th IEEE Electron Devices Technology and manufacturing (EDTM) Conference 2023, pp.P-033 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/66557 -
dc.language 영어 -
dc.publisher IEEE -
dc.title Resistive Switching Behaviors of CeO2–Based Memristors Depending on Electrode Materials for Non-Volatile Memory and Artificial Synaptic Device Applications -
dc.type Conference Paper -
dc.date.conferenceDate 2023-03-07 -

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