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DC Field | Value | Language |
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dc.citation.endPage | 85 | - |
dc.citation.startPage | 81 | - |
dc.citation.title | APPLIED SURFACE SCIENCE | - |
dc.citation.volume | 462 | - |
dc.contributor.author | Agrawal, Arpana | - |
dc.contributor.author | Tchoe, Youngbin | - |
dc.contributor.author | Kim, Heehun | - |
dc.contributor.author | Park, Joon Young | - |
dc.date.accessioned | 2023-12-21T19:45:43Z | - |
dc.date.available | 2023-12-21T19:45:43Z | - |
dc.date.created | 2023-06-07 | - |
dc.date.issued | 2018-12 | - |
dc.description.abstract | The mechanism of surfaces/interfaces and precise control of growth morphology is a key parameter for any specific device application. Herein, we report on a qualitative growth study of molecular beam epitaxy-grown polycrystalline InAs thin films on a lattice-mismatched Si(1 0 0) substrate using atomic force microscopy. The height-height correlation function (HHCF) and power spectral density function (PSDF) were employed to analyze the surface structures. Clear oscillatory behavior in the HHCF for sufficiently larger lateral distances suggests a mound-like morphology, which was confirmed by the existence of a characteristic frequency peak in the PSDF. The growth mechanism is described qualitatively by the Schwoebel barrier (roughening) effect coupled with the Mullins diffusion model (smoothing effect). | - |
dc.identifier.bibliographicCitation | APPLIED SURFACE SCIENCE, v.462, pp.81 - 85 | - |
dc.identifier.doi | 10.1016/j.apsusc.2018.08.076 | - |
dc.identifier.issn | 0169-4332 | - |
dc.identifier.scopusid | 2-s2.0-85051494654 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/64444 | - |
dc.identifier.wosid | 000447741800010 | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | Qualitative analysis of growth mechanism of polycrystalline InAs thin films grown by molecular beam epitaxy | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Chemistry; Materials Science; Physics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Height-height correlation function | - |
dc.subject.keywordAuthor | Power spectral density function | - |
dc.subject.keywordAuthor | Thin film | - |
dc.subject.keywordAuthor | Atomic force microscopy | - |
dc.subject.keywordPlus | SURFACE-ROUGHNESS | - |
dc.subject.keywordPlus | MICROSCOPY | - |
dc.subject.keywordPlus | DIFFUSION | - |
dc.subject.keywordPlus | MODELS | - |
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