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dc.citation.endPage 276 -
dc.citation.number 3 -
dc.citation.startPage 268 -
dc.citation.title Applied Chemistry for Engineering -
dc.citation.volume 32 -
dc.contributor.author Kwak, J.-Y. -
dc.contributor.author Jeong, J.-Y. -
dc.contributor.author Ju, J.-A. -
dc.contributor.author Kwon, Y.-P. -
dc.contributor.author Kim, Si-Hoon -
dc.contributor.author Choi, D.-S. -
dc.contributor.author Je, T.-J. -
dc.contributor.author Han, J.S. -
dc.contributor.author Jeon, Eun-chae -
dc.date.accessioned 2023-12-21T15:41:02Z -
dc.date.available 2023-12-21T15:41:02Z -
dc.date.created 2022-06-27 -
dc.date.issued 2021-06 -
dc.description.abstract As wireless communication devices become more common, interests in how to control the electromagnetic waves generated from the devices are increasing. One of the most commonly used electromagnetic wave control materials is magnetic one, but due to the features that make the product heavy and thick when applied to the product, it is difficult to use them in curved electronic devices. Therefore, a polymer flexible meta electronic device has been presented to sort out the problem, which is thin and can have various curvatures. However, it requires an additional evaluation of curvature reliability. In this study, we developed a method to predict electromagnetic wave control characteristics through the resistance/length of the conductive ink line patterns of polymer flexible meta electronic devices, which is inversely proportional to the electromagnetic wave control characteristics. As the radius of curvature decreased, the resistance/length increased, and there was little variations with the duration times of curvature. We also found that both permanent and recoverable changes along with the removal of curvature were occurred when the curvature was applied, and that the cause of these changes was newly created vertical cracks in the conductive ink line pattern due to the tensile stress applied by applying curvature. © 2021, Korean Society of Industrial Engineering Chemistry. All rights reserved. -
dc.identifier.bibliographicCitation Applied Chemistry for Engineering, v.32, no.3, pp.268 - 276 -
dc.identifier.doi 10.14478/ace.2021.1022 -
dc.identifier.issn 1225-0112 -
dc.identifier.scopusid 2-s2.0-85109522316 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/58819 -
dc.language 한국어 -
dc.publisher Korean Society of Industrial Engineering Chemistry -
dc.title Evaluation of the curvature reliability of polymer flexible meta electronic devices based on variations of the electrical properties -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.type.docType Article -
dc.description.journalRegisteredClass scopus -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Curvature reliability -
dc.subject.keywordAuthor Electrical property -
dc.subject.keywordAuthor Electromagnetic wave control -
dc.subject.keywordAuthor Flexible meta electronic device -

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